64 citations · 75 across the 8 of their papers we have counts for
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The Microscopic Structure of Stacking Faults in SrNaNbO
Robin Sjökvist, Yining Xie, Zabeada Aslam +4
Stacking faults and other topological defects in ferroics can have a significant influence on the electronic and mechanical properties of the material. Here, regular stacking fault…
Template masks for 4D-STEM
Yining Xie, Eoin Moynihan, Marin Alexe +3
We present a new analysis method for atomic resolution four-dimensional scanning transmission electron microscopy (4D-STEM, in which a diffraction pattern is collected at each poin…
Large-Angle Convergent-Beam Electron Diffraction Patterns via Conditional Generative Adversarial Networks
Joseph J. Webb, Richard Beanland, Rudolf A. Römer
We show how generative machine learning can be used for the rapid computation of strongly dynamical electron diffraction directly from crystal structures, specifically in large-ang…