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Direct Imaging of Electron Orbitals with a Scanning Transmission Electron Microscope
Ondrej Dyck, Jawaher Almutlaq, Jacob L. Swett +3
Recent studies of secondary electron (SE) emission in scanning transmission electron microscopes suggest that material's properties such as electrical conductivity, connectivity, a…
Mapping Conductance and Switching Behavior of Graphene Devices In Situ
Ondrej Dyck, Jacob L. Swett, Charalambos Evangeli +3
Graphene has been proposed for use in various nanodevice designs, many of which harness emergent quantum properties for device functionality. However, visualization, measurement, a…
Contrast mechanisms in secondary electron e-beam induced current (SEEBIC) imaging
Ondrej Dyck, Jacob L. Swett, Charalambos Evangeli +3
Over the last few years, a new mode for imaging in the scanning transmission electron microscope (STEM) has gained attention as it permits the direct visualization of sample conduc…