activity
20192026
most citedHigh-Throughput CNN Inference on Embedded ARM big.LITTLE Multi-Core Processors

136 citations · 202 across the 13 of their papers we have counts for

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8 papers · 1 filter

cs.AR2026

AMAX: Accuracy-Aware Multi-Loop Asymmetric Perforation for Heterogeneous Architectures

Amna Hassan, Paul Danielse, Anuj Pathania +2

Thermal constraints in heterogeneous multi-core systems can significantly degrade performance, as conventional techniques such as dynamic voltage and frequency scaling (DVFS) and t…

cs.AR2026

On the Impact of Degradation-Balanced Scheduling in Manycore Systems

Maria Pantazi-Kypraiou, George Goudroumanis, George Floros +2

Electromigration degradation in manycore systems depends strongly on how runtime workload is distributed across cores. Task placement affects power, temperature, and current densit…

cs.AR2026

Reinforcement Learning-Based Optimization of Workload-Aware Power Delivery Networks

Oran Hayes, Maria Pantazi-Kypraiou, Athanasios Tziouvaras +4

Power Delivery Networks (PDNs) are critical components of modern VLSI chips, providing stable voltage levels while satisfying electromigration (EM) and IR-drop constraints. Convent…

cs.AR2026

Fast Transformer Inference on ARM-Based HMPSoCs

Hang Xu, Yixian Shen, Thanassis Giannetsos +1

Transformer models have set new performance standards for machine learning (ML) tasks. However, their resource-intensive deployment on resource-constrained edge devices for cloud-f…

cs.AR2026

Workload-Aware Early-Stage Power Delivery Network Optimization via Architectural Power Traces

Oran Hayes, Maria Pantazi-Kypraiou, Athanasios Tziouvaras +4

Power Delivery Networks (PDNs) are critical for maintaining voltage integrity in modern multiprocessor systems. Conventional early-stage PDN planning relies on static or worst-case…

cs.AR2026

Multi-Partner Project: COIN-3D -- Collaborative Innovation in 3D VLSI Reliability

George Rafael Gourdoumanis, Fotoini Oikonomou, Maria Pantazi-Kypraiou +10

As semiconductor manufacturing advances from the 3-nm process toward the sub-nanometer regime and transitions from FinFETs to gate-all-around field-effect transistors (GAAFETs), th…