collaborators

1 paper

cond-mat.mtrl-sci2019

The Exit-Wave Power-Cepstrum Transform for Scanning Nanobeam Electron Diffraction: Robust Strain Mapping at Subnanometer Resolution and Subpicometer Precision

Elliot Padgett, Megan E. Holtz, Paul Cueva +4

Scanning nanobeam electron diffraction (NBED) with fast pixelated detectors is a valuable technique for rapid, spatially resolved mapping of lattice structure over a wide range of…