10 citations · 10 across the 3 of their papers we have counts for
3 papers
Predictive drift compensation of multi-frame STEM via live scan modification
Matthew Mosse, Jonathan J. P. Peters, Eoin Moynihan +4
Scanning transmission electron microscopy (STEM) is widely used tool for materials characterisation. However, being a scanned technique, STEM is susceptible to sample, stage or bea…
Interlacing in atomic resolution scanning transmission electron microscopy
Jonathan J. P Peters, Tiarnan Mullarkey, James A. Gott +2
Fast frame-rates are desirable in scanning transmission electron microscopy for a number of reasons: controlling electron beam dose, capturing in-situ events or reducing the appear…
Defect-Free Axially-Stacked GaAs/GaAsP Nanowire Quantum Dots with Strong Carrier Confinement
Yunyan Zhang, Anton V. Velichko, H. Aruni Fonseka +7
Axially-stacked quantum dots (QDs) in nanowires (NWs) have important applications in fabricating nanoscale quantum devices and lasers. Although their performances are very sensitiv…