collaborators

1 paper

cond-mat.mtrl-sci2020

Validation of secondary fluorescence excitation in quantitative X-ray fluorescence analysis of thin alloy films

André Wählisch, Cornelia Streeck, Philipp Hönicke +1

X-ray fluorescence (XRF) analysis is a widely applied technique for the quantitative analysis of thin films up to the m scale because of its non-destructive nature and because i…