collaborators

1 paper

cond-mat.mtrl-sci2020

Fast Pixelated Detectors in Scanning Transmission Electron Microscopy. Part II: Post Acquisition Data Processing, Visualisation, and Structural Characterisation

Gary W. Paterson, Robert W. H. Webster, Andrew Ross +5

Fast pixelated detectors incorporating direct electron detection (DED) technology are increasingly being regarded as universal detectors for scanning transmission electron microsco…