187 citations · 527 across the 12 of their papers we have counts for
7 papers · 1 filter
Rapid Cavity-Based Mid-Circuit Measurement and Feedforward in a Neutral Atom Array
Tsai-Chen Lee, Jacquelyn Ho, Yue-Hui Lu +4
Measuring part of a quantum system in the midst of its evolution and acting on the result in real time is essential for numerous quantum information protocols. Neutral-atom arrays…
Autler-Townes spectroscopy of a Rydberg ladder
Tai Xiang, Yue-Hui Lu, Jacquelyn Ho +3
Ladder-type two-photon excitation of an atom from a ground state , to an intermediate excited state , and, finally, to a Rydberg state , has a vari…
Higher symmetry breaking and non-reciprocity in a driven-dissipative Dicke model
Jacquelyn Ho, Yue-Hui Lu, Tai Xiang +3
Higher symmetries in interacting many-body systems often give rise to new phases and unexpected dynamical behavior. Here, we theoretically investigate a variant of the Dicke model…
Optomechanical self-organization in a mesoscopic atom array
Jacquelyn Ho, Yue-Hui Lu, Tai Xiang +5
Increasing the number of particles in a system often leads to qualitative changes in its properties, such as breaking of symmetries and the appearance of phase transitions. This re…
State-insensitive wavelengths for light shifts and photon scattering from Zeeman states
Stuart J. Masson, Zhenjie Yan, Jacquelyn Ho +3
Atoms are not two-level systems, and their rich internal structure often leads to complex phenomena in the presence of light. Here, we analyze off-resonant light scattering includi…
Super-radiant and Sub-radiant Cavity Scattering by Atom Arrays
Zhenjie Yan, Jacquelyn Ho, Yue-Hui Lu +3
We realize collective enhancement and suppression of light scattered by an array of tweezer-trapped Rb atoms positioned within a strongly coupled Fabry-Pérot optical cavity.…
Mid-circuit cavity measurement in a neutral atom array
Emma Deist, Yue-Hui Lu, Jacquelyn Ho +4
Subsystem readout during a quantum process, or mid-circuit measurement, is crucial for error correction in quantum computation, simulation, and metrology. Ideal mid-circuit measure…