39 citations · 130 across the 7 of their papers we have counts for
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cs.LG2022★ 4 cited
GNN4REL: Graph Neural Networks for Predicting Circuit Reliability Degradation
Lilas Alrahis, Johann Knechtel, Florian Klemme +2
Process variations and device aging impose profound challenges for circuit designers. Without a precise understanding of the impact of variations on the delay of circuit paths, gua…
cs.LG2022★ 39 cited
Modeling and Predicting Transistor Aging under Workload Dependency using Machine Learning
Paul R. Genssler, Hamza E. Barkam, Karthik Pandaram +2
The pivotal issue of reliability is one of colossal concern for circuit designers. The driving force is transistor aging, dependent on operating voltage and workload. At the design…