20 citations · 20 across the 2 of their papers we have counts for
3 papers
3D atomic structure determination with ultrashort-pulse MeV electron diffraction
Vincent Hennicke, Max Hachmann, Paul Benjamin Klar +22
Understanding structure at the atomic scale is fundamental for the development of materials with improved properties. Compared to other probes providing atomic resolution, electron…
Development of crystal optics for Multi-Projection X-ray Imaging for synchrotron and XFEL sources
Valerio Bellucci, Sarlota Birnsteinova, Tokushi Sato +27
X-ray Multi-Projection Imaging (XMPI) is an emerging technology that allows for the acquisition of millions of 3D images per second in samples opaque to visible light. This breakth…
A ray-trace analysis of X-ray multilayer Laue lenses for nanometer focusing
Henry N. Chapman, Saša Bajt
Thick diffractive optical elements offer a promising way to achieve focusing or imaging at a resolution approaching 1 nm for X-ray wavelengths shorter than about 0.1 nm. Efficient…