2 papers
cond-mat.mtrl-sci2025
3D atomic structure determination with ultrashort-pulse MeV electron diffraction
Vincent Hennicke, Max Hachmann, Paul Benjamin Klar +22
Understanding structure at the atomic scale is fundamental for the development of materials with improved properties. Compared to other probes providing atomic resolution, electron…
physics.optics2020
A ray-trace analysis of X-ray multilayer Laue lenses for nanometer focusing
Henry N. Chapman, Saša Bajt
Thick diffractive optical elements offer a promising way to achieve focusing or imaging at a resolution approaching 1 nm for X-ray wavelengths shorter than about 0.1 nm. Efficient…