2 papers
cs.LG2022
A Hybrid Deep Learning Model-based Remaining Useful Life Estimation for Reed Relay with Degradation Pattern Clustering
Chinthaka Gamanayake, Yan Qin, Chau Yuen +3
Reed relay serves as the fundamental component of functional testing, which closely relates to the successful quality inspection of electronics. To provide accurate remaining usefu…
eess.IV2020
Deep Learning Based Defect Detection for Solder Joints on Industrial X-Ray Circuit Board Images
Qianru Zhang, Meng Zhang, Chinthaka Gamanayake +7
Quality control is of vital importance during electronics production. As the methods of producing electronic circuits improve, there is an increasing chance of solder defects durin…