24 citations · 62 across the 4 of their papers we have counts for
4 papers
How Fast is Your Detector? The Effect of Temporal Response on Image Quality
Tiarnan Mullarkey, Matthew Geever, Jonathan J. P. Peters +3
With increasing interest in high-speed imaging should come an increased interest in the response times of our scanning transmission electron microscope (STEM) detectors. Previous w…
Interlacing in atomic resolution scanning transmission electron microscopy
Jonathan J. P Peters, Tiarnan Mullarkey, James A. Gott +2
Fast frame-rates are desirable in scanning transmission electron microscopy for a number of reasons: controlling electron beam dose, capturing in-situ events or reducing the appear…
Using Your Beam Efficiently: Reducing Electron-dose in the STEM via Flyback Compensation
Tiarnan Mullarkey, Jonathan J. P. Peters, Clive Downing +1
In the scanning transmission electron microscope, fast-scanning and frame-averaging are two widely used approaches for reducing electron-beam damage and increasing image signal-noi…
Development of a Practicable Digital Pulse Read-out for Dark-field STEM
Tiarnan Mullarkey, Clive Downing, Lewys Jones
When characterising beam-sensitive materials in the scanning transmission electron microscope (STEM), low-dose techniques are essential for the reliable observation of samples in t…