2 papers
cond-mat.mtrl-sci2021
A Fast Algorithm for Scanning Transmission Electron Microscopy (STEM) Imaging and 4D-STEM Diffraction Simulations
Philipp M Pelz, Alexander Rakowski, Luis Rangel DaCosta +3
Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are supported or validated with…
cond-mat.mtrl-sci2020
Multibeam Electron Diffraction
Xuhao Hong, Steven E Zeltmann, Benjamin H Savitzky +5
One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam e…