activity
20202026
most citedDigital Pixel Test Structures implemented in a 65 nm CMOS process

47 citations · 102 across the 15 of their papers we have counts for

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physics.ins-det2020

Charge collection properties of TowerJazz 180 nm CMOS Pixel Sensors in dependence of pixel geometries and bias parameters, studied using a dedicated test-vehicle: the Investigator chip

G. Aglieri Rinella, G. Chaosong, A. di Mauro +23

This paper contains a compilation of parameters influencing the charge collection process extracted from a comprehensive study of partially depleted Monolithic Active Pixel Sensors…