P. Kagerer

most citedX-ray diffraction tools for structural modeling of epitaxic films of an intrinsic antiferromagnetic topological insulator

1 citations · 1 across the 2 of their papers we have counts for

collaborators

3 papers

cond-mat.mtrl-sci2021

Simulation of X-ray diffraction in Mn $_{x}$ Bi $_{2}$ Te $_{3 + x}$ epitaxic films

Rafaela F. S. Penacchio, Celso I. Fornari, Yori G. Camillo +6

Disordered heterostructures stand as a general description for compounds that are part of homologous series such as bismuth chalcogenides. In device engineering, van der Waals epit…

cond-mat.mtrl-sci2021★ 1 cited

X-ray diffraction tools for structural modeling of epitaxic films of an intrinsic antiferromagnetic topological insulator

Rafaela F. S. Penacchio, Celso I. Fornari, Yori G. Camillo +6

Synthesis of new materials demands structural analysis tools suited to the particularities of each system. Van der Waals (vdW) materials are fundamental in emerging technologies of…

cond-mat.str-el2020

Incipient antiferromagnetism in the Eu-doped topological insulator Bi $_{2}$ Te $_{3}$

Abdul Tcakaev, Volodymyr B. Zabolotnyy, Celso I. Fornari +14

Rare earth ions typically exhibit larger magnetic moments than transition metal ions and thus promise the opening of a wider exchange gap in the Dirac surface states of topological…

Simulation of X-ray diffraction in Mnx​Bi2​Te3+x​ epitaxic films

X-ray diffraction tools for structural modeling of epitaxic films of an intrinsic antiferromagnetic topological insulator

Incipient antiferromagnetism in the Eu-doped topological insulator Bi2​Te3​

Simulation of X-ray diffraction in Mn $_{x}$ Bi $_{2}$ Te $_{3 + x}$ epitaxic films

Incipient antiferromagnetism in the Eu-doped topological insulator Bi $_{2}$ Te $_{3}$