activity
20182021
most citedMechanism of electron-beam manipulation of single dopant atoms in silicon

18 citations · 18 across the 1 of their papers we have counts for

collaborators

5 papers

cond-mat.mtrl-sci202118 cited

Mechanism of electron-beam manipulation of single dopant atoms in silicon

Alexander Markevich, Bethany M Hudak, Jacob Madsen +4

The precise positioning of dopant atoms within bulk crystal lattices could enable novel applications in areas including solid-state sensing and quantum computation. Established sca…

cond-mat.mtrl-sci2020

Interferometric 4D-STEM for Lattice Distortion and Interlayer Spacing Measurements in Bilayer and Trilayer Two-dimensional Materials

Michael J Zachman, Jacob Madsen, Xiang Zhang +3

Van der Waals materials composed of stacks of individual atomic layers have attracted considerable attention due to their exotic electronic properties that can be altered by, for e…

cond-mat.mtrl-sci2020

description of bonding for transmission electron microscopy

Jacob Madsen, Timothy J. Pennycook, Toma Susi

The simulation of transmission electron microscopy (TEM) images or diffraction patterns is often required to interpret their contrast and extract specimen features. This is especia…

cond-mat.mtrl-sci2018

Efficient first principles simulation of electron scattering factors for transmission electron microscopy

Toma Susi, Jacob Madsen, Ursula Ludacka +6

Electron microscopy is a powerful tool for studying the properties of materials down to their atomic structure. In many cases, the quantitative interpretation of images requires si…

cond-mat.mtrl-sci2018

A deep learning approach to identify local structures in atomic-resolution transmission electron microscopy images

Jacob Madsen, Pei Liu, Jens Kling +4

Recording atomic-resolution transmission electron microscopy (TEM) images is becoming increasingly routine. A new bottleneck is then analyzing this information, which often involve…