5 citations · 9 across the 6 of their papers we have counts for
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physics.med-ph2023★ 5 cited
Shot noise-mitigated secondary electron imaging with ion count-aided microscopy
Akshay Agarwal, Leila Kasaei, Xinglin He +6
Modern science is dependent on imaging on the nanoscale, often achieved through processes that detect secondary electrons created by a highly focused incident charged particle beam…
physics.med-ph2022★ 4 cited
Denoising Particle Beam Micrographs with Plug-and-Play Methods
Minxu Peng, Ruangrawee Kitichotkul, Sheila W. Seidel +2
In a particle beam microscope, a raster-scanned focused beam of particles interacts with a sample to generate a secondary electron (SE) signal pixel by pixel. Conventionally formed…