2 papers
cs.LG2022
Multilayer Perceptron Based Stress Evolution Analysis under DC Current Stressing for Multi-segment Wires
Tianshu Hou, Peining Zhen, Ngai Wong +4
Electromigration (EM) is one of the major concerns in the reliability analysis of very large scale integration (VLSI) systems due to the continuous technology scaling. Accurately p…
eess.IV2020
Rethinking the Extraction and Interaction of Multi-Scale Features for Vessel Segmentation
Yicheng Wu, Chengwei Pan, Shuqi Wang +3
Analyzing the morphological attributes of blood vessels plays a critical role in the computer-aided diagnosis of many cardiovascular and ophthalmologic diseases. Although being ext…