most citedDetermination of the Interface between Amorphous Insulator and Crystalline 4H-SiC in Transmission Electron Microscope Image by using Convolutional Neural Network

5 citations · 5 across the 1 of their papers we have counts for

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1 paper

cond-mat.mtrl-sci2020★ 5 cited

Determination of the Interface between Amorphous Insulator and Crystalline 4H-SiC in Transmission Electron Microscope Image by using Convolutional Neural Network

Hironori Yoshioka, Tomonori Honda

A rough interface seems to be one of the possible reasons for low channel mobility (conductivity) in SiC MOSFETs. To evaluate the mobility by interface roughness, we drew a boundar…