activity
20182021
collaborators

6 papers

physics.ins-det2021

Time-of-Flight Photoelectron Momentum Microscopy at 100-500 MHz Synchrotron Sources: Electron-Optical Chopping or Bandwidth Pre-Selection

G. Schoenhense, K. Medjanik, O. Fedchenko +10

The small time gap of synchrotron radiation in conventional multi-bunch mode (100-500MHz) is prohibitive for time-of-flight (ToF) based electron spectroscopy. Even the new generati…

physics.ins-det2020

Hard X-ray Photoelectron Momentum Microscopy and Kikuchi Diffraction on (In,Ga,Mn)As Thin Films

K. Medjanik, O. Fedchenko, O. Yastrubchak +9

Recent advances in the brilliance of hard-X-ray beamlines and photoelectron momentum microscopy facilitate bulk valence-band mapping and core-level-resolved hard-X-ray photoelectro…

physics.app-ph2020

Single-Hemisphere Photoelectron Momentum Microscope With Time-of-Flight Recording

G. Schoenhense, S. Babenkov, D. Vasilyev +2

Photoelectron momentum microscopy is an emerging powerful method for angle-resolved photoelectron spectroscopy (ARPES), especially in combination with imaging spin filters. These i…

cond-mat.mtrl-sci2018

Matrix-element induced spin polarization of photoelectrons from bulk bands

Dmitry Vasilyev, Katerina Medjanik, Sergey Babenkov +3

Angular- or -resolved photoelectron spectroscopy in the soft X-ray range gives access to the bulk electronic structure of materials. Here this technique is extended to the spin…

cond-mat.mtrl-sci2018

Breakthrough in HAXPES Performance Combining Full-Field k-Imaging with Time-of-Flight Recording

K. Medjanik, S. V. Babenkov, S. Chernov +8

We established a new approach to hard-X-ray photoelectron spectroscopy (HAXPES). The instrumental key feature is an increase of the dimensionality of the recording scheme from 2D t…

cond-mat.mtrl-sci2018

Momentum-Transfer Model of Valence-Band Photoelectron Diffraction

G. Schoenhense, K. Medjanik, S. Babenkov +6

Owing to strongly enhanced bulk sensitivity, angle- or momentum-resolved photoemission using X-rays is an emergent powerful tool for electronic structure mapping. A novel full-fiel…