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cs.CV2026
SePArate: Segmenting Patterns from Defects in Wafer Manufacturing Using Weak Supervision
Dain Kwon, Changmin Shin, Sunjong Park +5
In semiconductor manufacturing, defect analysis is essential, but manual inspection cannot scale. However, existing automated inspection methods remain insufficient for root-cause…
cs.CV2026
STARLINC: Satellite Trail Artifact Removal using Inter-Frame Correlation
Shingeon Kim, Hyeyoon Lee, Dain Kwon +5
The rapid expansion of low Earth orbit satellites such as Starlink is increasingly contaminating astronomical surveys. In practice, contaminated images are often identified through…