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R. Tokas

2 papers hereh-index 211.2k citations106 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • middle author1

Across the 1 of 2 papers where every author was matched, so the position is known.

fields
  • cond-mat.mtrl-sci2

identity via Semantic Scholar / OpenAlex

most citedPRISA: a simple software for determining refractive index, extinction co-efficient, dispersion energy, band gap, and thickness of semiconductor and dielectric thin films

23 citations · 31 across the 2 of their papers we have counts for

collaborators

2 papers

cond-mat.mtrl-sci2021★ 8 cited

Structure-property relations characterizing the devitrification of Ni-Zr glassy alloy thin films

Debarati Bhattacharya, S. Rayaprol, Kawsar Ali +6

The investigation of devitrification in thermally annealed nanodimensional glassy alloy thin films provides a comprehensive understanding of their thermal stability, which can be u…

cond-mat.mtrl-sci2020★ 23 cited

PRISA: a simple software for determining refractive index, extinction co-efficient, dispersion energy, band gap, and thickness of semiconductor and dielectric thin films

S. Jena, R. B. Tokas, S. Thakur +1

A simple user-friendly software named PRISA has been developed to determine optical constants (refractive index and extinction co-efficient), dispersion parameters (oscillator ener…

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