activity
20142023
most citedRabi-like splitting and refractive index sensing with hybrid Tamm plasmon-cavity modes

44 citations · 98 across the 8 of their papers we have counts for

collaborators

8 papers

cond-mat.mtrl-sci2023

Influence of swift heavy ion irradiation on structure and morphology of La0.25Pr0.375Ca0.375MnO3 perovskite film

Harsh Bhatt, Yogesh Kumar, R. B. Tokas +3

The effects of Ag15+ (120 MeV) swift heavy ion irradiation on the structural and morphological properties of epitaxial La0.25Pr0.375Ca0.375MnO3 (LPCMO) thin films was investigated…

cond-mat.mtrl-sci2021★ 8 cited

Structure-property relations characterizing the devitrification of Ni-Zr glassy alloy thin films

Debarati Bhattacharya, S. Rayaprol, Kawsar Ali +6

The investigation of devitrification in thermally annealed nanodimensional glassy alloy thin films provides a comprehensive understanding of their thermal stability, which can be u…

physics.optics2021★ 44 cited

Rabi-like splitting and refractive index sensing with hybrid Tamm plasmon-cavity modes

S. Jena, R. B. Tokas, S. Thakur +1

Rabi-like splitting and self-referenced refractive index sensing in hybrid plasmonic-1D photonic crystal structures have been theoretically demonstrated. The coupling between Tamm…

cond-mat.mtrl-sci2020★ 23 cited

PRISA: a simple software for determining refractive index, extinction co-efficient, dispersion energy, band gap, and thickness of semiconductor and dielectric thin films

S. Jena, R. B. Tokas, S. Thakur +1

A simple user-friendly software named PRISA has been developed to determine optical constants (refractive index and extinction co-efficient), dispersion parameters (oscillator ener…

cond-mat.mtrl-sci2016

Study of ZrO2 Thin Films Deposited at Glancing Angle by Magnetron Sputtering under Varying Substrate Rotation

R. B. Tokas, S. Jena, J. S. Mishal +7

In the present work, a set of ZrO2 thin films have been deposited at 82 degree angle of deposition at several substrate rotation speeds and at 0 degree. The effect of substrate rot…

cond-mat.mtrl-sci2015

Characterization of Micro-Roughness Parameters and Optical Properties of Obliquely Deposited HfO2 Thin Films

R B Tokas, S Jena, P Sarkar +2

Oblique angle deposited oxide thin films have opened up new dimensions in fabricating optical interference devices with tailored refractive index profile along thickness by tuning…

cond-mat.mtrl-sci2014★ 2 cited

Oblique Angle Deposition of HfO2 Thin Films: Investigation of Elastic and Micro Structural Properties

R B Tokas, S Jena, P Sarkar +4

Oblique angle deposition of oxides is being famous for fabricating inhomogeneous thin films with variation of refractive index along thickness in a functional form. Inhomogeneous l…

cond-mat.mtrl-sci2014★ 21 cited

Structure related optical properties of electron beam evaporated ZrO2:10%SiO2 thin films

S. Jena, R. B. Tokas, S. Thakur +1

ZrO2:10%SiO2 thinfilms have been deposited on fused silica substrate by reactive electron beam co-evaporation technique at different oxygen partial pressure. The structural analysi…