activity
20142022
most citedTamm plasmon polariton in planar structures: A brief overview and applications

93 citations · 137 across the 5 of their papers we have counts for

collaborators

5 papers

physics.optics2022★ 93 cited

Tamm plasmon polariton in planar structures: A brief overview and applications

Chinmaya Kar, Shuvendu Jena, Dinesh V. Udupa +1

Tamm plasmon provides a new avenue in plasmonics of interface states in planar multilayer structures due to its strong light matter interaction. This article reviews the research a…

cond-mat.mtrl-sci2020★ 23 cited

PRISA: a simple software for determining refractive index, extinction co-efficient, dispersion energy, band gap, and thickness of semiconductor and dielectric thin films

S. Jena, R. B. Tokas, S. Thakur +1

A simple user-friendly software named PRISA has been developed to determine optical constants (refractive index and extinction co-efficient), dispersion parameters (oscillator ener…

cond-mat.mtrl-sci2016

Study of ZrO2 Thin Films Deposited at Glancing Angle by Magnetron Sputtering under Varying Substrate Rotation

R. B. Tokas, S. Jena, J. S. Mishal +7

In the present work, a set of ZrO2 thin films have been deposited at 82 degree angle of deposition at several substrate rotation speeds and at 0 degree. The effect of substrate rot…

cond-mat.mtrl-sci2015

Characterization of Micro-Roughness Parameters and Optical Properties of Obliquely Deposited HfO2 Thin Films

R B Tokas, S Jena, P Sarkar +2

Oblique angle deposited oxide thin films have opened up new dimensions in fabricating optical interference devices with tailored refractive index profile along thickness by tuning…

cond-mat.mtrl-sci2014★ 21 cited

Structure related optical properties of electron beam evaporated ZrO2:10%SiO2 thin films

S. Jena, R. B. Tokas, S. Thakur +1

ZrO2:10%SiO2 thinfilms have been deposited on fused silica substrate by reactive electron beam co-evaporation technique at different oxygen partial pressure. The structural analysi…