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cond-mat.mtrl-sci2024
Defect density of states of tin oxide and copper oxide p-type thin-film transistors
Måns J. Mattsson, Kham M. Niang, Jared Parker +4
The complete subgap defect density of states (DoS) is measured using the ultrabroadband (0.15 to 3.5 eV) photoconduction response from p-type thin-film transistors (TFTs) of tin ox…
cond-mat.mtrl-sci2020
Role of ALD Al2O3 surface passivation on the performance of p-type Cu2O thin film transistors
Mari Napari, Tahmida N. Huq, David J. Meeth +10
High-performance p-type oxide thin film transistors (TFTs) have great potential for many semiconductor applications. However, these devices typically suffer from low hole mobility…