2 papers
physics.ins-det2024
On the Influence of Parallax Effects in Thick Silicon Sensors in Coherent Diffraction Imaging
Markus Kuster, Robert Hartmann, Steffen Hauf +3
Structure determination is a key application of XFELs and 4th generation synchrotron sources, particularly using the coherent and pulsed X-ray radiation from X-ray free-electron la…
physics.ins-det2020
The 1-Megapixel pnCCD Detector for the Small Quantum Systems Instrument at the European XFEL: System and Operation Aspects
Markus Kuster, Karim Ahmed, Kai-Erik Ballak +21
The X-ray free-electron lasers that became available during the last decade, like the European XFEL (EuXFEL), place high demands on their instrumentation. Especially at low photon…