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19992024
most citedX-ray diffraction from isolated and strongly aligned gas-phase molecules with a free-electron laser

272 citations · 480 across the 6 of their papers we have counts for

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physics.ins-det2024

On the Influence of Parallax Effects in Thick Silicon Sensors in Coherent Diffraction Imaging

Markus Kuster, Robert Hartmann, Steffen Hauf +3

Structure determination is a key application of XFELs and 4th generation synchrotron sources, particularly using the coherent and pulsed X-ray radiation from X-ray free-electron la…