2 papers
cond-mat.mtrl-sci2008
Polarization dependent interface properties of ferroelectric Schottky barriers studied by soft X-ray absorption spectroscopy
H. Kohlstedt, A. Petraru, M. Meier J. Denlinger +11
We applied soft X-ray absorption spectroscopy to study the Ti L-edge in ferroelectric capacitors using a modified total electron yield method. The inner photo currents and the X-ra…
cond-mat.supr-con2008★ 1 cited
Observation of Spin Fluctuations in a High-Tc Parent Compound Using Resonant Inelastic X-ray Scattering
B. Freelon, P. G. Medaglia, A. Tebano +12
We report the first observation of soft-x-ray scattering from spin fluctuations in a high-Tc parent compound. An antiferromagnetic charge transfer insulator, CaCuO2, was irradiated…