38 citations · 116 across the 22 of their papers we have counts for
6 papers · 1 filter
Microscopy X-ray Imaging enriched with Small Angle X-ray Scattering for few nanometer resolution reveals shock waves and compression in intense short pulse laser irradiation of solids
Thomas Kluge, Arthur Hirsch-Passicos, Jannis Schulz +23
Understanding how laser pulses compress solids into high-energy-density states requires diagnostics that simultaneously resolve macroscopic geometry and nanometer-scale structure.…
Probing laser-driven surface and subsurface dynamics via grazing-incidence XFEL scattering and diffraction
Lisa Randolph, Özgül Öztürk, Dmitriy Ksenzov +34
We demonstrate a grazing-incidence x-ray platform that simultaneously records time-resolved grazing-incidence small-angle x-ray scattering (GISAXS) and grazing-incidence x-ray diff…
Probing ultrafast heating and ionization dynamics in solid density plasmas with time-resolved resonant X-ray absorption and emission
Lingen Huang, Mikhail Mishchenko, Michal Šmíd +34
Heating and ionization are among the most fundamental processes in relativistic laser--solid interactions; however, their spatiotemporal evolution remains challenging to capture ex…
Demonstration of full-scale spatio-temporal diagnostics of solid-density plasmas driven by an ultra-short relativistic laser pulse using an X-ray free-electron laser
Lingen Huang, Michal Šmíd, Long Yang +42
Understanding the complex plasma dynamics in ultra-intense relativistic laser-solid interactions is of fundamental importance to the applications of laser plasma-based particle acc…
High-Quality Ultra-Fast Total Scattering and Pair Distribution Function Data using an X-ray Free Electron Laser
Adam F. Sapnik, Philip A. Chater, Dean S. Keeble +48
High-quality total scattering data, a key tool for understanding atomic-scale structure in disordered materials, require stable instrumentation and access to high momentum transfer…
Strong geometry dependence of the X-ray Thomson Scattering Spectrum in single crystal silicon
Thomas Gawne, Zhandos A. Moldabekov, Oliver S. Humphries +17
We report on results from an experiment at the European XFEL where we measured the x-ray Thomson scattering (XRTS) spectrum of single crystal silicon with ultrahigh resolution. Com…