U. Kılıç

activity

20182025

most citedControlling the broadband enhanced light chirality with L-shaped dielectric metamaterials

32 citations · 93 across the 7 of their papers we have counts for

collaborators

Showing cond-mat.mtrl-sciShow all

3 papers · 1 filter

cond-mat.mtrl-sci2022

Strain and composition dependencies of the near bandgap optical transitions in monoclinic (Al $_{x}$ Ga $_{1 - x}$ ) $_{2}$ O $_{3}$ alloys with coherent biaxial in-plane strain on (010) Ga $_{2}$ O $_{3}$

Rafał Korlacki, Matthew Hilfiker, Jenna Knudtson +7

The bowing of the energy of the three lowest band-to-band transitions in $β$ -(Al $_{x}$ Ga $_{1 - x}$ ) $_{2}$ O $_{3}$ alloys was resolved using a combined density functional theory (DFT) and…

cond-mat.mtrl-sci2021★ 27 cited

Anisotropic dielectric functions, band-to-band transitions, and critical points in α-Ga2O3

Matthew Hilfiker, Rafał Korlacki, Riena Jinno +6

We use a combined generalized spectroscopic ellipsometry and density functional theory approach to determine and analyze the anisotropic dielectric functions of an $α$ -Ga $_{2}$ O $_{3}$ …

cond-mat.mtrl-sci2018

Critical-point model dielectric function analysis of WO $_{3}$ thin films deposited by atomic layer deposition techniques

Ufuk Kilic, Derek Sekora, Alyssa Mock +5

WO3 thin films were grown by atomic layer deposition and spectroscopic ellipsometry data gathered in the photon energy range of 0.72-8.5 eV and from multiple samples was utilized t…

Strain and composition dependencies of the near bandgap optical transitions in monoclinic (Alx​Ga1−x​)2​O3​ alloys with coherent biaxial in-plane strain on (010) Ga2​O3​

Anisotropic dielectric functions, band-to-band transitions, and critical points in α-Ga2O3

Critical-point model dielectric function analysis of WO3​ thin films deposited by atomic layer deposition techniques

Strain and composition dependencies of the near bandgap optical transitions in monoclinic (Al $_{x}$ Ga $_{1 - x}$ ) $_{2}$ O $_{3}$ alloys with coherent biaxial in-plane strain on (010) Ga $_{2}$ O $_{3}$

Critical-point model dielectric function analysis of WO $_{3}$ thin films deposited by atomic layer deposition techniques