352 citations · 973 across the 19 of their papers we have counts for
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High-resolution 3D phase-contrast imaging beyond the depth of field limit via ptychographic multi-slice electron tomography
Andrey Romanov, Min Gee Cho, Mary Cooper Scott +2
Resolving single atoms in large-scale volumes has been a goal for atomic resolution microscopy for a long time. Electron microscopy has come close to this goal using a combination…
A robust synthetic data generation framework for machine learning in High-Resolution Transmission Electron Microscopy (HRTEM)
Luis Rangel DaCosta, Katherine Sytwu, Catherine Groschner +1
Machine learning techniques are attractive options for developing highly-accurate automated analysis tools for nanomaterials characterization, including high-resolution transmissio…
Iterative Phase Retrieval Algorithms for Scanning Transmission Electron Microscopy
Georgios Varnavides, Stephanie M. Ribet, Steven E. Zeltmann +7
Scanning transmission electron microscopy (STEM) has been extensively used for imaging complex materials down to atomic resolution. The most commonly employed STEM modality, annula…
Generalization Across Experimental Parameters in Machine Learning Analysis of High Resolution Transmission Electron Microscopy Datasets
Katherine Sytwu, Luis Rangel DaCosta, Mary C. Scott
Neural networks are promising tools for high-throughput and accurate transmission electron microscopy (TEM) analysis of nanomaterials, but are known to generalize poorly on data th…
The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy
Peter Ercius, Ian J. Johnson, Philipp Pelz +19
We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 8…
Imaging 3D Chemistry at 1 nm Resolution with Fused Multi-Modal Electron Tomography
Jonathan Schwartz, Zichao Wendy Di, Yi Jiang +15
Measuring the three-dimensional (3D) distribution of chemistry in nanoscale matter is a longstanding challenge for metrological science. The inelastic scattering events required fo…