2 papers
cond-mat.mtrl-sci2023
Fabrication of Specimens for Atom Probe Tomography Using a Combined Gallium and Neon Focused Ion Beam Milling Approach
Frances I. Allen, Paul T. Blanchard, Russell Lake +6
We demonstrate a new focused ion beam sample preparation method for atom probe tomography. The key aspect of the new method is that we use a neon ion beam for the final tip-shaping…
cond-mat.mtrl-sci2021
Laser-assisted atom probe tomography of c-plane and m-plane InGaN test structures
N. A. Sanford, P. T. Blanchard, M. D. Brubaker +6
Laser-assisted atom probe tomography (APT) was used to measure the indium mole fraction x of c-plane, MOCVD-grown, GaN/In(x)Ga(1-x)N/GaN test structures and the results were compar…