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cs.CV2024★ 1 cited
Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects
Zhining Hu, Tobias Schlosser, Michael Friedrich +3
In semiconductor manufacturing, the wafer dicing process is central yet vulnerable to defects that significantly impair yield - the proportion of defect-free chips. Deep neural net…
cs.CV2021
Improving Automated Visual Fault Detection by Combining a Biologically Plausible Model of Visual Attention with Deep Learning
Frederik Beuth, Tobias Schlosser, Michael Friedrich +1
It is a long-term goal to transfer biological processing principles as well as the power of human recognition into machine vision and engineering systems. One of such principles is…