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cond-mat.mtrl-sci2025
Computation and Sensitivity Analysis of the Deformation-Gradient Tensor Reconstruction in Dark-Field X-ray Microscopy
Brinthan Kanesalingam, Darshan Chalise, Carsten Detlefs +1
Spatially resolved strain measurements are crucial to understanding the properties of engineering materials. Although strain measurements utilizing techniques such as transmission…
physics.app-ph2025
Planar 3 and 2 Method for Increased Sensitivity to Through-Plane Thermal Properties
Darshan Chalise, Brinthan Kanesalingam, Divya Chalise
Accurately measuring the thermal properties of buried interfaces is crucial for understanding heat transport in multilayered materials, particularly in applications such as batteri…