activity
20242026
most citedUnravelling the Role of Stacking Disorder on the Optoelectronic Properties of Zn3P2

1 citations · 1 across the 2 of their papers we have counts for

collaborators

8 papers

cond-mat.mtrl-sci2026

Complex polar superstructure controlled thermal conductivity in ferroelectric PbTiO3/SrTiO3 superlattices

Noa Varela-Domínguez, Marcel S. Claro, Araceli Gutiérrez-Llorente +8

Integrating epitaxial thin films of ferroelectric PbTiO3 and paraelectric SrTiO3 into artificially layered periodic superlattices provides a unique platform for tuning strain, depo…

cond-mat.mtrl-sci20261 cited

Unravelling the Role of Stacking Disorder on the Optoelectronic Properties of Zn3P2

Francesco Salutari, Nico Kawashima, Aidas Urbonavicius +9

Zinc phosphide (Zn3P2) is a promising photovoltaic absorber for thin-film and flexible solar cells due to its earth-abundant composition and favourable optoelectronic properties. R…

cond-mat.mtrl-sci2025

Unconventional cross sections in zinc phosphide nanowires grown using exclusively earth-abundant components

Simon Escobar Steinvall, Hampus Thulin, Nico Kawashima +8

To enable lightweight and flexible solar cell applications it is imperative to develop direct bandgap absorber materials. Moreover, to enhance the potential sustainability impact o…

cond-mat.mes-hall2025

Engineering Ge profiles in Si/SiGe heterostructures for increased valley splitting

Lucas E. A. Stehouwer, Merrit P. Losert, Maia Rigot +6

Electron spin qubits in Si/SiGe quantum wells are limited by the small and variable energy separation of the conduction band valleys. While sharp quantum well interfaces are pursue…

cond-mat.mtrl-sci2025

Enhancing atomic-resolution in electron microscopy: A frequency-domain deep learning denoiser

Ivan Pinto-Huguet, Marc Botifoll, Xuli Chen +6

Atomic resolution electron microscopy, particularly high-angle annular dark-field scanning transmission electron microscopy, has become an essential tool for many scientific fields…

cond-mat.mtrl-sci2025

Artificial Intelligence-Assisted Workflow for Transmission Electron Microscopy: From Data Analysis Automation to Materials Knowledge Unveiling

Marc Botifoll, Ivan Pinto-Huguet, Enzo Rotunno +17

(Scanning) transmission electron microscopy ((S)TEM) has significantly advanced materials science but faces challenges in correlating precise atomic structure information with the…