4 citations · 6 across the 3 of their papers we have counts for
3 papers
Utilizing Generative Adversarial Networks for Image Data Augmentation and Classification of Semiconductor Wafer Dicing Induced Defects
Zhining Hu, Tobias Schlosser, Michael Friedrich +3
In semiconductor manufacturing, the wafer dicing process is central yet vulnerable to defects that significantly impair yield - the proportion of defect-free chips. Deep neural net…
Attention Modules Improve Modern Image-Level Anomaly Detection: A DifferNet Case Study
André Luiz B. Vieira e Silva, Francisco Simões, Danny Kowerko +3
Within (semi-)automated visual inspection, learning-based approaches for assessing visual defects, including deep neural networks, enable the processing of otherwise small defect p…
Attention Modules Improve Image-Level Anomaly Detection for Industrial Inspection: A DifferNet Case Study
André Luiz Buarque Vieira e Silva, Francisco Simões, Danny Kowerko +3
Within (semi-)automated visual industrial inspection, learning-based approaches for assessing visual defects, including deep neural networks, enable the processing of otherwise sma…