activity
20212023
most citedAutomated experiment in 4D-STEM: exploring emergent physics and structural behaviors

1 citations · 3 across the 7 of their papers we have counts for

collaborators

7 papers

cond-mat.mtrl-sci2023

Dynamic STEM-EELS for single atom and defect measurement during electron beam transformations

Kevin M. Roccapriore, Riccardo Torsi, Joshua Robinson +2

On- and off-axis electron energy loss spectroscopy (EELS) is a powerful method for probing local electronic structure on single atom level. However, many materials undergo electron…

cond-mat.mtrl-sci2023

When the atoms dance: exploring mechanisms of electron-beam induced modifications of materials with machine-learning assisted high temporal resolution electron microscopy

Matthew G. Boebinger, Ayana Ghosh, Kevin M. Roccapriore +6

Directed atomic fabrication using an aberration-corrected scanning transmission electron microscope (STEM) opens new pathways for atomic engineering of functional materials. In thi…

cond-mat.mtrl-sci2023

Human-in-the-loop: The future of Machine Learning in Automated Electron Microscopy

Sergei V. Kalinin, Yongtao Liu, Arpan Biswas +5

Machine learning methods are progressively gaining acceptance in the electron microscopy community for de-noising, semantic segmentation, and dimensionality reduction of data post-…

cond-mat.mtrl-sci20231 cited

Designing Workflows for Materials Characterization

Sergei V. Kalinin, Maxim Ziatdinov, Mahshid Ahmadi +4

Experimental science is enabled by the combination of synthesis, imaging, and functional characterization. Synthesis of a new material is typically followed by a set of characteriz…

cond-mat.mes-hall2023

Photon bunching in cathodoluminescence induced by indirect electron excitation

Vasudevan Iyer, Kevin Roccapriore, Jacob Ng +3

The impulsive excitation of ensembles of excitons or color centers by a high-energy electron beam results in the observation of photon bunching in the second-order correlation func…

cond-mat.dis-nn20221 cited

Probing electron beam induced transformations on a single defect level via automated scanning transmission electron microscopy

Kevin M. Roccapriore, Matthew G. Boebinger, Ondrej Dyck +4

The robust approach for real-time analysis of the scanning transmission electron microscopy (STEM) data streams, based on the ensemble learning and iterative training (ELIT) of dee…