74 citations · 209 across the 5 of their papers we have counts for
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cond-mat.mes-hall2017★ 8 cited
Effect of lateral tip motion on multifrequency atomic force microscopy
Joseph L. Garrett, Lisa J. Krayer, Kevin J. Palm +1
In atomic force microscopy (AFM), the angle relative to the vertical () that the tip apex of a cantilever moves is determined by the tilt of the probe holder and the geometr…
cond-mat.mes-hall2016★ 74 cited
Fast, high-resolution surface potential measurements in air with heterodyne Kelvin probe force microscopy
Joseph L. Garrett, Jeremy N. Munday
Kelvin probe force microscopy (KPFM) adapts an atomic force microscope to measure electric potential on surfaces at nanometer length scales. Here we demonstrate that Heterodyne-KPF…