Architectural-Space Exploration of Heterogeneous Reliability and Checkpointing Modes for Out-of-Order Superscalar Processors

Bharath Srinivas Prabakaran, Mihika Dave, Florian Kriebel +2

Reliability has emerged as a key topic of interest for researchers around the world to detect and/or mitigate the side effects of decreasing transistor sizes, such as soft errors.…