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cond-mat.mtrl-sci2025
Measurements and scaling of X-ray total scattering from single crystals
S. Gorfman, M. Eremenko, V. Krayzman +3
We present a measurement protocol and a data reduction workflow for obtaining single-crystal X-ray total-scattering datasets that capture both Bragg-peak and diffuse scattering int…
cond-mat.mtrl-sci2018★ 9 cited
High pressure crystal structure and electronic properties of bismuth silicate Bi2SiO5 from synchrotron experiment and first principle calculations
Adrien Girard, Michal Stekiel, Hiroki Taniguchi +4
The high pressure structural properties of bismuth oxide Bi2SiO5 have been investigated up to 28 GPa using in situ powder synchrotron X-ray diffraction and up to 50 GPa with DFT ca…