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physics.app-ph2018
Characterization and Modeling of 0.18μm CMOS Technology at sub-Kelvin Temperature
Tengteng Lu, Zhen Li, Chao Luo +3
Previous cryogenic electronics studies are most above 4.2K. In this paper we present the cryogenic characterization of a 0.18μm standard bulk CMOS technology(1.8V and 5V) at sub-ke…
physics.app-ph2018
Cryogenic Characerization and Modeling of Standard CMOS down to Liquid Helium Temperature for Quantum Computing
Zhen Li, Chao Luo, Tengteng Lu +3
Cryogenic characterization and modeling of 0.18um CMOS technology (1.8V and 5V) are presented in this paper. Several PMOS and NMOS transistors with different width to length ratios…