6 citations · 6 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2025
Strong geometry dependence of the X-ray Thomson Scattering Spectrum in single crystal silicon
Thomas Gawne, Zhandos A. Moldabekov, Oliver S. Humphries +17
We report on results from an experiment at the European XFEL where we measured the x-ray Thomson scattering (XRTS) spectrum of single crystal silicon with ultrahigh resolution. Com…
physics.ins-det2018★ 6 cited
Characterization of the ePix100a and the FastCCD Semiconductor Detectors for the European XFEL
I. Klačková, G. Blaj, P. Denes +6
The European X-ray Free Electron Laser (EuXFEL) is a research facility providing spatially coherent X-ray flashes in the energy range from 0.25keV to 25keV of unprecedented brillia…