23 citations · 33 across the 2 of their papers we have counts for
3 papers
Linear Ascending Metrological Algorithm
M. R. Perelshtein, N. S. Kirsanov, V. V. Zemlyanov +4
The ubiquitous presence of shot noise sets a fundamental limit to the measurement precision in classical metrology. Recent advances in quantum devices and novel quantum algorithms…
Broadband lumped-element Josephson parametric amplifier with single-step lithography
T. Elo, T. S. Abhilash, M. R. Perelshtein +3
We present a lumped-element Josephson parametric amplifier (JPA) utilizing a straightforward fabrication process involving a single electron beam lithography step followed by doubl…
Phase estimation algorithm for the multibeam optical metrology
V. V. Zemlyanov, N. S. Kirsanov, M. R. Perelshtein +5
Unitary Fourier transform lies at the core of the multitudinous computational and metrological algorithms. Here we show experimentally how the unitary Fourier transform-based phase…