2 papers
physics.app-ph2018
Amplitude dependence of resonance frequency and its consequences for scanning probe microscopy
Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro +2
With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample intera…
physics.app-ph2018
Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors
Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro +1
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sa…