7 citations · 8 across the 3 of their papers we have counts for
3 papers
Amplitude dependence of resonance frequency and its consequences for scanning probe microscopy
Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro +2
With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample intera…
Eliminating the effect of acoustic noise on cantilever spring constant calibration
Aaron Mascaro, Yoichi Miyahara, Omur E. Dagdeviren +1
A common use for atomic force microscopy is to quantify local forces through tip-sample interactions between the probe tip and a sample surface. The accuracy of these measurements…
Calibration of the oscillation amplitude of electrically excited scanning probe microscopy sensors
Omur E. Dagdeviren, Yoichi Miyahara, Aaron Mascaro +1
Atomic force microscopy (AFM) is an analytical surface characterization tool which can reveal a sample's topography with high spatial resolution while simultaneously probing tip-sa…