165 citations · 330 across the 20 of their papers we have counts for
6 papers · 1 filter
AMAX: Accuracy-Aware Multi-Loop Asymmetric Perforation for Heterogeneous Architectures
Amna Hassan, Paul Danielse, Anuj Pathania +2
Thermal constraints in heterogeneous multi-core systems can significantly degrade performance, as conventional techniques such as dynamic voltage and frequency scaling (DVFS) and t…
UniCASE: A Unified 16-bit Floating-Point Format with Criticality-Aware Selective ECC for Efficient DNN Protection
Amna Hassan, Semeen Rehman
Soft errors are an increasing reliability concern for Deep Neural Network execution because they can corrupt parameters, leading to accuracy degradation. While conventional ECC off…
EXTENT: Enabling Approximation-Oriented Energy Efficient STT-RAM Write Circuit
Saeed Seyedfaraji, Javad Talafy Daryani, Mohamed M. Sabry Aly +1
Spin Transfer Torque Random Access Memory (STT-RAM) has garnered interest due to its various characteristics such as non-volatility, low leakage power, high density. Its magnetic p…
SMART: Investigating the Impact of Threshold Voltage Suppression in an In-SRAM Multiplication/Accumulation Accelerator for Accuracy Improvement in 65 nm CMOS Technology
Saeed Seyedfaraji, Baset Mesgari, Semeen Rehman
State-of-the-art in-memory computation has recently emerged as the most promising solution to overcome design challenges related to data movement inside current computing systems.…
AID: Accuracy Improvement of Analog Discharge-Based in-SRAM Multiplication Accelerator
Saeed Seyedfaraji, Baset Mesgari, Semeen Rehman
This paper presents a novel circuit (AID) to improve the accuracy of an energy-efficient in-memory multiplier using a standard 6T-SRAM. The state-of-the-art discharge-based in-SRAM…
Architectural-Space Exploration of Heterogeneous Reliability and Checkpointing Modes for Out-of-Order Superscalar Processors
Bharath Srinivas Prabakaran, Mihika Dave, Florian Kriebel +2
Reliability has emerged as a key topic of interest for researchers around the world to detect and/or mitigate the side effects of decreasing transistor sizes, such as soft errors.…