14 citations · 14 across the 1 of their papers we have counts for
3 papers
Direct Measurement of the Electron Beam Intensity Profile via Carbon Nanotube Tomography
Matthew Zotta, Sharadh Jois, Prathamesh Dhakras +2
Electron microscopes have been improved to achieve ever smaller beam spots, a key parameter that determines the instrument's resolution. The techniques to measure the size of the b…
Super-ideal diodes at the Schottky-Mott limit in gated graphene-WSe heterojunctions
Samuel W. LaGasse, Prathamesh Dhakras, Takashi Taniguchi +2
Metal-semiconductor interfaces, known as Schottky junctions, have long been hindered by defects and impurities. Such imperfections dominate the electrical characteristics of the ju…
Two-Parameter Quasi-Ballistic Transport Model for Nanoscale Transistors
Ramya Cuduvally, Prathamesh Dhakras, Phung Nguyen +2
We show that by adding only two fitting parameters to a purely ballistic transport model, we can accurately characterize the current-voltage characteristics of nanoscale MOSFETs. T…