◍wovepaper
SearchResearchersInstitutions
Sign in
researcher

S. Jois

3 papers hereh-index 446 citations14 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • middle author3

Across the 3 of 3 papers where every author was matched, so the position is known.

fields
  • cond-mat.mes-hall1
  • physics.app-ph1
  • physics.ins-det1
same name
  • S. Jois — 5 papers
  • S. Jois — 1 paper, h 3

Either other researchers who publish under this name, or the same person where the external sources have not merged their records.

identity via Semantic Scholar / OpenAlex

most citedDirect Measurement of the Electron Beam Intensity Profile via Carbon Nanotube Tomography

14 citations · 19 across the 3 of their papers we have counts for

collaborators
Showing physics.app-phShow all

1 paper · 1 filter

physics.app-ph2019★ 14 cited

Direct Measurement of the Electron Beam Intensity Profile via Carbon Nanotube Tomography

Matthew Zotta, Sharadh Jois, Prathamesh Dhakras +2

Electron microscopes have been improved to achieve ever smaller beam spots, a key parameter that determines the instrument's resolution. The techniques to measure the size of the b…

◍wovepaper

Papers, researchers and institutions, woven together.

Explore
  • Search
  • Researchers
  • Institutions
Account
  • Library
  • Chat
Data
  • arXiv.org
  • Semantic Scholar
  • OpenAlex
  • Latest RSS
AboutContactPrivacyDevelopersllms.txtopenapi.json
Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.