22 citations · 48 across the 4 of their papers we have counts for
3 papers
cond-mat.mtrl-sci2023★ 3 cited
Disorder and cavity evolution in single-crystalline Ge during implantation of Sb ions monitored in-situ by spectroscopic ellipsometry
Tivadar Lohner, Attila Nemeth, Zsolt Zolnai +12
Ion implantation has been a key technology for the controlled surface modification of materials in microelectronics and generally, for tribology, biocompatibility, corrosion resist…
physics.optics2023★ 1 cited
Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry
Deshabrato Mukherjee, Benjamin Kalas, Sven Burger +4
Spectroscopic ellipsometry is a sensitive and optical model-supported quantitative tool to monitor interfaces. In this work, solid-liquid interfaces are studied using the Kretschma…
physics.comp-ph2019★ 22 cited
Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method
B. Fodor, P. Kozma, S. Burger +2
We used numerical simulations based on the finite element method (FEM) to calculate both the amplitude and phase information of the scattered electric field from random rough surfa…