Thickness characterization of atomically-thin WSe${}_2$ on epitaxial graphene by low-energy electron reflectivity oscillations

Sergio C. de la Barrera, Yu-Chuan Lin, Sarah M. Eichfeld +4

In this work, low-energy electron microscopy is employed to probe structural as well as electronic information in few-layer WSe${}_2$ on epitaxial graphene on SiC. The emergence of u…