2 papers
cond-mat.mtrl-sci2025
Etching-to-deposition transition in SiO/SiN using CHF ion-based plasma etching: An atomistic study with neural network potentials
Hyungmin An, Sangmin Oh, Dongheon Lee +4
Plasma etching, a critical process in semiconductor fabrication, utilizes hydrofluorocarbons both as etchants and as precursors for carbon film formation, where precise control ove…
physics.comp-ph2019
Atomic energy mapping of neural network potential
Dongsun Yoo, Kyuhyun Lee, Wonseok Jeong +2
We show that the intelligence of the machine-learning potential arises from its ability to infer the reference atomic-energy function from a given set of total energies. By utilizi…