118 citations · 1.1k across the 58 of their papers we have counts for
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Calibrated force measurement in Atomic Force Microscopy using the Transient Fluctuation Theorem
Samuel Albert, Aubin Archambault, Artyom Petrosyan +3
The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a co…
Functionalized AFM probes for force spectroscopy: eigenmodes shape and stiffness calibration through thermal noise measurements
Justine Laurent, Audrey Steinberger, Ludovic Bellon
The functionalization of an Atomic Force Microscope (AFM) cantilever with a colloidal bead is a widely used technique when the geometry between the probe and the sample must be con…
Carbon nanotubes adhesion and nanomechanical behavior from peeling force spectroscopy
Julien Buchoux, Ludovic Bellon, Sophie Marsaudon +1
Applications based on Single Walled Carbon Nanotube (SWNT) are good example of the great need to continuously develop metrology methods in the field of nanotechnology. Contact and…